Effect of crystallite size and precursor molarities on electrical conductivity in ZnO thin films

In present paper, ZnO thin films were deposited using the simple, flexible and cost-effective spray ultrasonic technique at different precursor molarity values. The films deposited on glass substrate at 350 °C. The electrical and structural properties were studied as a function of precursor molarity. The as sprayed films exhibit an hexagonal structure wurtzite and (002) oriented with the maximum value of crystallite size G = 31.82 nm is measured of ZnO film sprayed with 0.1 M. The crystallites size in the thin films depend by the defect (less defects), where the minimum defects confirmed the high crystallinity. The maximum value of electrical conductivity of the films is 7.96 (Ω.cm)-1obtained in ZnO thin film for precursor molarity 0.125 M. The correlation between the electrical and the structural properties with the precursor molarity suggests that the electrical conductivity of the films is predominantly influenced by the crystallite size and the precursor molarity. The measurement in the electrical conductivity of the films with correlation it is equal to the experimental with the error is about 0.3 % in the higher conductivity.

• ZnO thin films
• precursor molarity
• crystallite size
• electrical conductivity
• wurtzite structure
• (002) orientation
• crystallinity
• defects

• ZnO doping and properties
• Thin-Film Transistor Technologies
• Advanced Materials and Semiconductor Technologies
• ZnO thin films
• precursor molarity
• crystallite size
• electrical conductivity
• wurtzite structure
• (002) orientation
• crystallinity
• defects
• Materials Chemistry
• Electrical and Electronic Engineering
• Materials Science
• Engineering